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Conference > About XTOPAbout XTOPThe first XTOP conference X-Ray Topography and High Resolution Diffraction took place in Marseille in 1992. The original topics covered were X-ray topography, double- and triple-crystal diffractometry, reflectometry and standing waves technique. Later, other topics such as small-angle scattering and a broad portfolio of imaging were added. XTOP brings together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, as well as X-ray absorption and phase contrast imaging. XTOP is thus one of the central scientific conference concerning methods and instrumentation in laboratory and synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography. Previous XTOP conferences: |
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