Invited speakers

List of confirmed invited speakers

• Ana Diaz, PSI (Switzerland); session 1 - Imaging (full field and scanning microscopy; phase contrast imaging; coherent diffraction imaging; high resolution diffraction imaging; topography)

• Felix Hofmann, Oxford University (UK); session 2 - Probing matter with coherent X-rays

• Vincent Favre-Nicolin, ESRF (France/Europe); session 3 - Theory: crystal theory vs experiments, high throughput computing, phase retrieval, statistial approaches deep learning, AI

• Andrej Singer, Cornell U. (USA); session 4 - Crystal defects: theory vs experiments

• Can Yildirim, ESRF (France/Europe); session 5 - Strain and stress analysis

• Ehrenfried Zschech, Brandenburg University of Technology Cottbus-Senftenberg (Germany); session 6 - Industrial applications with X-ray scattering

• Hyunjung Kim, Sogang University (Korea); session 7 - In situ & operando experiments

• Stefano Toso, IIT Genova (Italy); session 8 - SAXS, reflectivity, grazing incidence scattering

• Gema Martinez-Criado, ESRF (France/Europe); session 9 - XFEL and new sources

Tutorials

• Ian K. Robinson, Brookhaven National Laboratory (USA): Basic concepts of X-ray scattering and prospects

• Marie-Ingrid Richard, CEA Grenoble (France): Bragg coherent diffraction imaging and its applications

• Frank Schreiber, University of Tübingen (Germany): X-ray surface scattering and its applications

• Jean-Sébastien Micha, ESRF (France): Laue microdiffraction

• Virginie Chamard, Institut Frensel (France): X-ray ptychography microscopy and its applications

Historical conferences

• José Baruchel, Emeritus scientist at ESRF (France): History of the XTOP conference.

• Michèle Sauvage, Emeritus Senior Scientist at SOLEIL (France) and Cécile Malgrange, Emeritus Professor, Sorbonne University (France): Conference in the honor of Prof. André Authier.