› Unveiling 3D Bulk Strain and Orientation with Dark Field X-ray Microscopy - Can Yildirim, European Synchroton Radiation Facility [Grenoble]
09:30-10:00 (30min)
› Reconstruction of deformation gradient tensor fields in polycrystalline materials from near-field diffraction data - Wolfgang Ludwig, Matériaux, ingénierie et science [Villeurbanne], European Synchroton Radiation Facility [Grenoble] - Peter Reischig, Innocryst Ldt., Daresbury
10:00-10:15 (15min)
› Two Dimensional Strain Tensor Tomography - Peter Modregger, Universität Siegen [Siegen], Center for X-ray and Nano Science, DESY
10:15-10:30 (15min)
Session XIV: Industrial applications with X-ray scattering
Chair: Stéphanie Escoubas
› High-resolution X-ray imaging in the laboratory – Status and perspectives - Ehrenfried Zschech, Brandenburg University of Technology Cottbus-Senftenberg
11:00-11:30 (30min)
› µLaue diffraction and XEOL analysis for nitride materials studies - Joël Eymery, CEA IRIG MEM NRX, UGA
11:30-11:45 (15min)